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Methods for Determination of the Optical Constants of the Substance BiTe-BiSe

Received: 29 November 2014     Accepted: 15 December 2014     Published: 22 December 2014
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Abstract

On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known.

Published in American Journal of Physics and Applications (Volume 2, Issue 6)
DOI 10.11648/j.ajpa.20140206.16
Page(s) 150-155
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This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2014. Published by Science Publishing Group

Keywords

Structure, Optical Constants, Absorption Coefficientl, Surface

References
[1] Moss T.S. // Semiconductor Opto-Electronics, Butterworth-Heinemann (1973) 454.
[2] Axmedov G. // The phase composition of the films of Bi-S formation Bi2S3 different substructure, Fizika i texnika poluprovodnikov, (2008) vol. 42. no.2. pp. 129-130. (in Russian)
[3] Qalant E. Apparatus for measuring small absorption coefficients inactive in the active elements of the laser glass. Journal of Applied Spectroscopy. 18, (1973) №4, 636 (in Russian)
[4] Axmedov G. Kinetic of phase transformations of Bi2Se3 nanotickness films, Scientifik Israel – technological advantages (2011) vol. 13. no.4. pp. 57-62.
[5] Ch. Hu, Winnery D.R., New Termooptical Measurement Method and a Comparison with other Methods, Appl. Optics 12, #1, 72 (1973)
[6] Donovan T.M., Seraphin B.O., Undemaged Germanium Surfaces of High Optical Quality, J. Electrochem. Soc., (1962) 109, 877
[7] Rozenberq Q. Optical thin film coatings. Fizmatqiz, 1958 (in Russian)
[8] Valeev A. Determination of optical constants of thin weakly absorbing layers. Optics and Spectroscopy. 15, (1963) 500 (in Russian)
[9] Axmedov G. Physical Properties and Influence of the Tempering on Electric Properties Films Bi2Te3, International Journal of Materials Science and Applications. Vol. 3, No. 3, 2014, pp. 111-115. doi: 10.11648/j.ijmsa.20140303.17
[10] Ismailov D., Axmedov G., Shafizade R. // Reports of Academy of Azerbaijan (1989). vol. XLV. no.4. pp. 4. (in Russian)
Cite This Article
  • APA Style

    Gurban Axmedov. (2014). Methods for Determination of the Optical Constants of the Substance BiTe-BiSe. American Journal of Physics and Applications, 2(6), 150-155. https://doi.org/10.11648/j.ajpa.20140206.16

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    ACS Style

    Gurban Axmedov. Methods for Determination of the Optical Constants of the Substance BiTe-BiSe. Am. J. Phys. Appl. 2014, 2(6), 150-155. doi: 10.11648/j.ajpa.20140206.16

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    AMA Style

    Gurban Axmedov. Methods for Determination of the Optical Constants of the Substance BiTe-BiSe. Am J Phys Appl. 2014;2(6):150-155. doi: 10.11648/j.ajpa.20140206.16

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  • @article{10.11648/j.ajpa.20140206.16,
      author = {Gurban Axmedov},
      title = {Methods for Determination of the Optical Constants of the Substance BiTe-BiSe},
      journal = {American Journal of Physics and Applications},
      volume = {2},
      number = {6},
      pages = {150-155},
      doi = {10.11648/j.ajpa.20140206.16},
      url = {https://doi.org/10.11648/j.ajpa.20140206.16},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20140206.16},
      abstract = {On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known.},
     year = {2014}
    }
    

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    T1  - Methods for Determination of the Optical Constants of the Substance BiTe-BiSe
    AU  - Gurban Axmedov
    Y1  - 2014/12/22
    PY  - 2014
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    DO  - 10.11648/j.ajpa.20140206.16
    T2  - American Journal of Physics and Applications
    JF  - American Journal of Physics and Applications
    JO  - American Journal of Physics and Applications
    SP  - 150
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    PB  - Science Publishing Group
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    AB  - On the basis of the interference fringes in the transparency and reflection spectra of the free film or a film on the substrate when the substrate and the film material does not absorb light, can be determined by one of the optical constants of the material at a blank principal refractive index, if the film thickness is known.
    VL  - 2
    IS  - 6
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Author Information
  • Institute of Physics of Azerbaijan NAS, Baku, Azerbaijan

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